Publications Research publications Publication status Research publication status Annual reports Bose Archive Prof. S. N. Bose Archive
Newsletter
Screen Reader Access
EN

सत्येंद्र नाथ बसु राष्ट्रीय मौलिक विज्ञान केंद्र

सत्येंद्र नाथ बसु राष्ट्रीय मौलिक विज्ञान केंद्र

S. N. Bose National Centre for Basic Sciences

Publications Research publications Publication status Research publication status Annual reports Bose Archive Prof. S. N. Bose Archive
Research publications Research publication status Annual reports Newsletter Prof. S. N. Bose Archive

Menu

Facilities
Technical Cell - Central Equipment Facilities

Atomic Force Microscopy (AFM)

Equipments

System Configurations

Operates in Contact Mode, Tapping Mode, Phase Imaging, Lift Mode, Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), Lateral Force Microscopy, Force Spectroscopy.

Optional: Scanning Tunneling Microscopy (STM), Conductive Atomic Force Microscopy (CAFM), Nanolithography.

Model no: di INNOVA; Location: AFM lab, S.N. Bose National Centre For Basic Sciences
Model no: di INNOVA; Location: AFM lab, S.N. Bose National Centre For Basic Sciences

Measurement Performance

Standard
Scanner
Large Area(~90μm) piezoelectric scanner.
Large area scanner
XY > 90μm, Z > 7.5μm
Closed-loop XY noise
<1.2 nm RMS, typical imaging bandwidth
Z-Linearizer noise
< 200 pm RMS, typical imaging bandwidth
Open-loop XY drift
< 1 nm/min
Closed-loop XY drift
< 3 nm/min
Optics
5x motorized zoom, software controlled
10x objective
System software
NanoDrive v8 real-time control & NanoScope Analysis

Operating Environment

Temperature: 0ºC to 30ºC, 32ºF to 112ºF.
Humidity: < 60%; non condensing.