Publications Research publications Publication status Research publication status Annual reports Bose Archive Prof. S. N. Bose Archive

Screen Reader Access

EN

सत्येंद्र नाथ बसु राष्ट्रीय मौलिक विज्ञान केंद्र

सत्येंद्र नाथ बसु राष्ट्रीय मौलिक विज्ञान केंद्र

S. N. Bose National Centre for Basic Sciences

Publications Research publications Publication status Research publication status Annual reports Bose Archive Prof. S. N. Bose Archive

Facilities

Technical Cell - Central Equipment Facilities

Field Emission Scanning Electron Microscopy (FESEM)

Equipments

Field Emission Scanning Electron Microscopy instrument

Technical Specification

Source of electron

FEG Source

Operational accelerating voltage

5ae82edfe12a6230ebaa0a6a

Resolution

@30KV@High vacuum conditions

1.2nm

@30KV@Low vacuum conditions

3.0nm

Detectors

Everhart-thornley detector for secondary electrons in high vacuum.
GSED for pressures up to 2600KPA in ESEM mode operation.
Large field secondary electron detector for low vacuum operation.
Back scattered electron detector in high vacuum mode imaging.

Fields of Research

FESEM imaging with high resolution and high contrast.
Chemical analysis (EDAX).
Investigations of non-conductive specimens under low-vacuum conditions.
Investigations of wet samples at pressures up to 2600PA under ESEM mode.