सत्येंद्र नाथ बसु राष्ट्रीय मौलिक विज्ञान केंद्र

सत्येंद्र नाथ बसु राष्ट्रीय मौलिक विज्ञान केंद्र

S. N. Bose National Centre for Basic Sciences

Facilities

Field Emission Scanning Electron Microscopy (FESEM)

Field Emission Scanning Electron Microscopy instrument
Field Emission Scanning Electron Microscopy instrument
Technical Specification
Source of electron
FEG Source
Operational accelerating voltage
200 V-30 KV
Resolution
@30KV@High vacuum conditions
1.2nm
@30KV@Low vacuum conditions
3.0nm

Detectors

  • Everhart-thornley detector for secondary electrons in high vacuum.
  • GSED for pressures up to 2600KPA in ESEM mode operation.
  • Large field secondary electron detector for low vacuum operation.
  • Back scattered electron detector in high vacuum mode imaging.

Fields of Research

  • FESEM imaging with high resolution and high contrast.
  • Chemical analysis (EDAX).
  • Investigations of non-conductive specimens under low-vacuum conditions.
  • Investigations of wet samples at pressures up to 2600PA under ESEM mode.