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सत्येंद्र नाथ बसु राष्ट्रीय मौलिक विज्ञान केंद्र

सत्येंद्र नाथ बसु राष्ट्रीय मौलिक विज्ञान केंद्र

S. N. Bose National Centre for Basic Sciences

Publications Research publications Publication status Research publication status Annual reports Bose Archive Prof. S. N. Bose Archive

Facilities

Technical Cell - Central Equipment Facilities

X-ray Diffractometer (XRD)

Equipments

This is a PANalytical X-PERT PRO XRD unit installed in 2005 and it has the capability of performing

Powder diffraction
Thin film and multi-layer reflectivity
High resolution rocking curve analysis
Stress/texture analysis
Small angle x-ray scattering (SAXS)

X-ray Diffractometer unit

Specifications and Performance

Model No.

PANalytical X-PERT PRO

Source of X-Rays

Cu Kα, 1.54 Å. (wave length), Mo Kα, 0.71 Å (Wavelength)

Detector

Pixcel dectector, Scintillation detector

Sample stage

Fixed, with X-Ray source & Detector rotation.

Sample Holders

Sample holders are made of Aluminium, for powder samples with a volume of 15 mm×20 mm×1.8mm.

Zero background capillaries & fibres

Zero background sample holder is an obliquely cutted silicon crystal which can be used to mount very small amount of powder (< 1 mg).

Measurement range

5º to 140º

Working condition

45 KV & 40 mA

Upgradation

The system has been upgraded with high temperature attachment (1500 ºC) attachment.